EE10 - IS-U: Device Management

The development package EE10 contains objects for "IS-U: Device Management".
 It is a subpackage in its parent development package IS-U/CCS. It belongs to software component IS-U-DM.
This development package contains no child development packages.

Tables for development package EE10

Table
Description
EDEVGRMaster Data for Device Group
EDEVGR_CDChange Document for Dev. Group: Table with Device Data
EEAGInput/Output Group
EGEREDraw and Sampling Number of a Device
EGERHHistorical Data of ISU Device Master Record
EGERRDevice data: Info record for point of delivery - historical
EGERSIS-U Device Master Data
EGLODevices per Sample Lot
EGTURPeriodic Replacement List
EGTUR_HEADCreation Data for Periodic Repl. List EGTUR
EKOGCommand Group
ETYPDevice Category: IS-U Additional Data for the Material
EWIKWinding Group
EZWGRegister Group
EZWG_HEADRegister Group: Header Data
TE025ASample Device Determination
TE025BExtension Periods for Official Lots
TE025CSample Device Determination
TE025DSample Algorithm Determination
TE055Function Classes
TE055TFunction Classes (text)
TE057Basic DeviceCat.
TE057TBasic Dev. Cats (Text)
TE059Register Display Types
TE059TRegister Display Types (texts)
TE063Manufacturer
TE065Register Identif.
TE065TRegister IDs (text)
TE068Permissibility of Register Codes for Each Division Category
TE1001Power Transformer: Loss Determination Group
TE1001TPower Transformer: Loss Determination Group (Text)
TE1002Combination of Rating, Primary, and Secondary Voltage
TE1002TCombination of Rating, Primary, and Secondary Voltage (Text)
TE131Movement Types for Lot Creation for Certification
TE237Constr.Cls
TE237TConstruction class (text)
TE263Permiss. Combinations of Basic Dev. Cats per Division Cat.
TE269Dev.Req. Planning
TE270System Parameters for Sampling Proc./Cert. in IS-U DevMan.
TE270EGERRSystem Parameters for Dev. Info Records (IS-U Device Mgmnt)
TE270EZWG_DIMUnits of Measurement for Register Categories of Reg. Group
TE270WGSystem Parameters for Winding Group
TE271Sample Lot
TE271ESample Lot - Canadian Sampling Inspection
TE275Search Term for Winding Grp
TE275TSearch Term for Winding Group (Txt)
TE276Nominal Voltage
TE276TNominal Voltage (Text)
TE285Accuracy Class
TE285TAccuracy Class (Text)
TE359Certificat. Types
TE359TCertificat. Types (Texts)
TE371Switching Times of a Command
TE373Command/Programming
TE373TCommand/Programming (texts)
TE379Winding Demand
TE379TWinding Demand (Text)
TE381Winding Types
TE381TWinding Types (text)
TE383Input/Output Cat.
TE383TInput/output category (text)
TE385Function Type
TE385TFunction Type (Txt)
TE387Input/Output Values
TE387TInput/Output Values (Text)
TE389Input/Output Connections
TE389TInput/Output Connections (Text)
TE523Register Types
TE523TRegister Types (Text)
TE525Search Term for Register Grp
TE525TRegister Group Search Term (Text)
TE527Search Term for I/O Grp
TE527TSearch Term: I/O Group (Text)
TE554Random Number Table According to DIN 5741
TE571Sample Devs per Sample Lot
TE587Search Term for Command Grp
TE587TSearch Terms for Com. Groups (Txt)
TE593Types of Device Group
TE593TTypes of Device Group (Text)
TE595Allocation of Group Type to Division
TE683Periodic Repl. Variants
TE684Control Parameter: Periodic Repl.
TE690Control Parameters for Creation of Orders and Notifications
TE927Parametr. for Device
TE927TParametrzn for Device (Txt)
TE937Seal Code for Sample Lot
TE937TSeal Codes for Sample Lot (Text)
TE9XX1Help Table for Specifying Material/Equipment Ref.
TEAPPRVLNRAlloc. of Manufacturer/Cat. Desc. to Inspection No. (B/NL)
TEDEVCLTYPEControl Parameters for Linking Classif. System to Dev.
TEKEMAKZSeal Indicator (B/NL)
TEKENNZIFFRegister Codes
TEKENNZIFFTRegister Code Texts
TELOT_CRDEFSpecifications for Lot Compilation (B/NL)
TELOT_LOCKEDBlocked Devices During Lot Compilation (B/NL)
TELOT_RESULTResults of Lot Allocation for Belgium/Netherlands
TELOT_RESULT_TOPHeader Table for Lot Allocation Results for B/NL
TEMANUFCATCombination: Manufact./Manufact.Cat.Descr. and DevCat.(B/NL)
TEPPMPrepayment Meter
TEPPMTPrepayment Meter Texts
TEPRRELInspection Relevance of Devices: Indicator
TEPRRELTInspection Relevance of Devices: Indicator (Text)
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