TE270 - System Parameters for Sampling Proc./Cert. in IS-U DevMan.

System Parameters for Sampling Proc./Cert. in IS-U DevMan. information is stored in SAP table TE270.
It is part of development package EE10 in software component IS-U-DM. This development package consists of objects that can be grouped under "IS-U: Device Management".

Fields for table TE270

Field Name	Description	Is Key	Data Element	Data Type	Length	Check Table
MANDT	Client	X	MANDT	CLNT	3	T000
VERLOS	Indicator: Loss of lot membership if removed/replaced		VERLOS	CHAR	1
VERBGL	Loss of certifiction if removed/replaced		VERBGL	CHAR	1
BGLLOS	Device certification failure leads to loss of lot membership		BGLLOS	CHAR	1
INTPRF	Internal cert. period is longer than calibration validity		INTPRF	CHAR	1
LOSLAGER	Uninstalled Devices Can Be Allocated to Lot		LOSLAGER	CHAR	1
CHLOS	Manipulation of devices despite lot inspection/drawing		CHLOS	CHAR	1
LAGINC	Warehouse devices allowed as sample devices		LAGINC	CHAR	1
NLEG97	Certification/seal extension control		NLEG97	CHAR	1
NLBGLJ	Certification year same as installation year		NLBGLJ	CHAR	1
CHSTI	Repeated use of devices for inspection		CHSTI	CHAR	1
CHBGL	Retain lot membership during certification		CHBGL	CHAR	1
CERTDEV	Certification period of device overrides lot		CERTDEV	CHAR	1
CERTLOTDEV	Only certified devices can be allocated to lots		CERTLOTDEV	CHAR	1
NO_SAMPLE_DEV	Exclude devices from sample drawing in I/R/R		NO_SAMPLE_DEV	CHAR	1
SEALDATECHECK	Check Last Seal Date Against Current Date		SEALDATECHECK	CHAR	1
LOT_BREAKUP_PERI	No. of Years Within Which Lot Devices Must Be Replaced		LOT_BREAKUP_PERIOD	NUMC	1